A critical requirement for testing a component in-circuit is to ensure good electrical contact with the pins of the device being tested. Although there are many commercially available test clips, they are often fragile and limited to the more common device package types.
Diagnosys has designed and developed an extensive range of robust and reliable DTIs (Device Test Interfaces) for in-circuit test of ICs in a test environment. This range includes DTIs for fine pitch devices, through-hole devices and underside probing. In addition to this standard range, custom DTIs can be provided to accommodate the many varied and diverse package designs you may encounter.
While all test interfaces will eventually see some wear and tear, the Diagnosys DTIs are also designed to be repaired, not thrown away!