The XJTAG series of products offers compliant boundary scan development tools. Its JTAG (Joint Test Action Group) development system offers a highly competitive solution for designers and developers of electronic circuits. Utilizing XJTAG allows the circuit development and prototyping process to be shortened significantly by facilitating early test development, early design validation, fast development of functional tests and test re-use across circuits that use the same devices.
XJTAG was the first boundary scan solution to offer a common platform for use by design and development engineers, test engineers, contract manufacturers and field test engineers, providing testing of not only JTAG-enabled devices but non-JTAG devices as well.
JTAG is a technology that has existed for over a decade. However, its potential as a testing and programming tool is only just beginning to be fully realized.
Advances in silicon design such as increasing device density and, more recently, BGA packaging has reduced the efficiency of traditional testing methods.
In order to overcome these problems, some of the world’s leading silicon manufacturers combined to form the Joint Test Action Group. The findings and recommendations of this group were used as the basis for the Institute of Electrical and Electronic Engineers standard.